Bypass Diode Thermal Test System
Meets the bypass diode thermal test requirements in the 4.18 clause of the IEC 61215-2016 and MST25 clause of the IEC 61730 standard.
l Intelligent control of the current value, emit pulse current within 1ms.
l During pulse current, parameters such as pulse current, diode voltage drop, and junction box temperature are collected
l Module could be controlled at 30℃, 50℃, 70℃, 90℃.
l Automatically simulate the relationship between VD and TJ by least squares method;
l Could offer the steady current up to 1.25 times Isc.
l All data can be exported in EXCEL format for processing and analysis.
l Test the functionality of the diode(test the IV curve).
Current pulse width
Current pulse width accuracy
Pulse current accuracy
Pulse voltage range
Pulse voltage accuracy
Positive constant current range
Positive constant current accuracy
Module Temperature range
Temperature monitoring range
Temperature monitoring accuracy
Temperature monitoring repeatability