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Bypass Diode Thermal Test System
Product description
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Meets the bypass diode thermal test requirements in the 4.18 clause of the IEC 61215-2016 and MST25 clause of the IEC 61730 standard.
l Intelligent control of the current value, emit pulse current within 1ms.
l During pulse current, parameters such as pulse current, diode voltage drop, and junction box temperature are collected
l Module could be controlled at 30℃, 50℃, 70℃, 90℃.
l Automatically simulate the relationship between VD and TJ by least squares method;
l Could offer the steady current up to 1.25 times Isc.
l All data can be exported in EXCEL format for processing and analysis.
l Test the functionality of the diode(test the IV curve).
Item | Parameters |
Pulse current | 0～20A |
Current pulse width | 50～300us |
Current pulse width accuracy | ±5% |
Pulse current accuracy | ±2% |
Pulse voltage range | 0～15V |
Pulse voltage accuracy | ±2% |
Positive constant current range | 0～20A |
Positive constant current accuracy | ±1% |
Module Temperature range | 20～100℃ |
Temperature monitoring range | 0～300℃ |
Temperature monitoring accuracy | ±2℃ |
Temperature monitoring repeatability | 0.5℃ |
